JAL Group to Participate in “e-Passport Tests” With Government Ministries
Tokyo January 14, 2005: The JAL Group will participate in “e-Passport Tests” containing passengers’ biometric data in cooperation with relevant Japanese ministries from February 2005 to March 2005.
The Ministry of Land, Infrastructure and Transport (MLIT) and the JAL Group will carry out tests of secure and smooth flight airport procedures at Tokyo’s Narita Airport.
Participants will be able to experience smooth check-in and immigration control procedures in an upgraded version of “e-check-in tests” that took place last year. In the latest tests, passengers taking part will be issued with a “SPT Card (SPT = simplifying passenger travel) embedded with an IC (integrated circuit) chip containing the holder’s biometric data to use at verification machines for check-in, security checks and immigration control, thus shortening the time waiting in queues.
＊(Relevant Japanese ministries include: Cabin Secretariat, Ministry of Land, Infrastructure and Transport, Ministry of Justice, Ministry of Foreign Affairs and the Ministry of Economy, Trade and Industry.)
JAL will also participate in tests using experimental IC ‘’bio-passports’’ containing the holder’s facial image that will be issued by the Ministry of Foreign Affairs for use by diplomatic passport holders.
Outline details of the test programme
（１）Length or period: the test period planned for the e-Passport tests is from early February to late March 2005
（２）Participants will be selected from JAL Global Club members and JAL Mileage Bank members, etc. （JAL plans to request the cooperation of those customers who took part in the earlier e-check-in tests.）. The targeted number of participants will be about 500 persons.
（３）Test procedure content: evaluation of practical use of biometrics, i.e. facial, iris and fingerprint authentication technology for check-in, security checks and immigration control.
|e passport rls.pdf|